Isonic 2005 A-Scan Ultrasonic Flaw Detector

ADVANCED NDT LIMITED,
Orchard House, Orchard Close, Severn Stoke, Worcester, UK    WR8 9JJ
Telephone: 44 (0) 1905 371460        *** Fax:   44 (0) 1905 371477
E-Mail: sales@advanced-ndt.co.uk *** Website:   www.advanced-ndt.co.uk

Conventional pulse echo and through transmission A-Scan-based inspection using the Isonic 2005 Ultrasonic Flaw Detector

640X480 pixels A-Scan display with physical dimensions 130 x 90 mm (5.12" x 3.62") of working area is largest one for the plurality of portable ultrasonic flaw detectors

Combined adjustable spike wave / square wave pulser equipped with variety of probe impedance matching coils provides optimal ultrasound penetration for various materials characterized either by high or low grain, sound attenuation etc

High frequency probes are automatically protected from being damaged even if the instruments pulse energy is set to exceptionally high levels. A detection circuit monitors the probe and adjusts the firing pulse to acceptable levels preventing damage to the probe.

46 dB dynamic range 20 dB/µs maximum slope multiple curve DAC/TCG may be created using up to 40 data points to correct distance – amplitude variations of ultrasonic signals

Both theoretical and experimental DAC may be activated either through keying in dB/mm (dB/") factor or through sequential recording echo amplitudes from variously located equal reflectors

DAC/TCG may be applied to rectified A-Scans (positive, negative, and full wave) and to RF A-Scans as well

Thanks to extended dynamic range signals significantly exceeding the A-Scan height (up to 199.9%) may be evaluated without dropping instrument Gain

Gain and Gates settings may be adjusted even on a frozen A-Scan bringing the signals to the necessary evaluation level and performing the required measurements

Dual Ultrasound Velocity Measurement Mode extremely simplifies resolving of sound path distances for dissimilar materials adjacent to each other whereas different values of ultrasound velocity are valid for corresponding signals appearing on the same A-Scan

RF display mode combined with frequency domain signal analysis enhances capabilities of the instrument for materials characterization, bond inspection, testing of dissimilar materials, defect pattern analysis, and probes evaluation

Optional data logger organizes and manages database files capable to store up to 254745 thickness readings each and organized as 2D matrix. In database every thickness reading is accompanied with corresponding raw data A-Scan and instrument setup. Automatic creating of MS Excel^® thickness spreadsheet meets requirements of various Risk Based Inspection and Maintenance (RBIM) procedures