Isonic 2006 Technical details - Advanced NDT Ltd.

Pulse Type:

Positive Spike Pulse / Positive Square Wave Pulse

Initial Transition:

≤5 ns (10-90%)

Pulse Amplitude:

Spike pulse - smoothly tunable (18 levels) 50V … 400 V into 50 Ω at 4 levels of excitation energy
Square wave pulse - smoothly tunable (18 levels) 50V … 400 V into 50 Ω

Pulse Duration:

Spike pulse - 10…70 ns for 50 Ω load depending on Energy and Damping setup
Square wave pulse - 65…600 ns controllable in 5 ns step with driving of both leading edge and trailing edge of the pulse

Energy (Spike Pulse):

4 discrete energy values / 40 μJ (min) to 250 μJ (max) – at 400V amplitude

Modes:

Single / Dual

Damping:

17 discrete resistances values / 25Ω min to 1000 Ω max

Internal Matching Coil – Probe Impedance Matching:

16 discrete inductivity values / 2 μH min to 78 μH max

PRF:

0 – optionally; 15...5000 Hz controllable in 1 Hz resolution

Optional Sync Output / Input:

Max +5V, τ ≤ 5 ns, t ≥100 ns, Load Impedance ≥50 Ω

Gain:

0...120 dB controllable in 0.5 dB resolution

Advanced Low Noise Design:

93 μV peak to peak input referred to 80 dB gain / 35 MHz bandwidth

Frequency Band:

0.35...35 MHz Wide Band / 34 Sub Bands

Ultrasound Velocity:

300...20000 m/s (11.81…787.4 "/ms) controllable in 1 m/s (0.1 "/ms) resolution

Range:

0.5...3000 μs - controllable in 0.01 μs resolution

Display Delay:

0...3200 μs - controllable in 0.01 μs resolution

Probe Angle:

0…90° controllable in 1° resolution

Probe Delay:

0 to 70 μs controllable in 0.01μs resolution - expandable

Display Modes

RF, Rectified (Full Wave / Negative or Positive Half Wave), Signal's Spectrum (FFT)

Reject:

0...99 % of screen height controllable in 1% resolution

DAC / TCG:

Theoretical – through keying in dB/mm (dB/") factor
Experimental – through sequential recording echo amplitudes from variously located equal reflectors
46 dB Dynamic Range, Slope ≤ 20 dB/μs, Capacity ≤40 points
Available for Rectified and RF Display

DGS:

Standard Library for 18 probes / unlimitedly expandable

Gates:

2 Independent Gates / unlimitedly expandable

Gate Start and Width:

Controllable over whole variety of A-Scan Display Delay and A-Scan Range settings
in 0.1 mm /// 0.001" resolution

Gate Threshold:

5…95 % of A-Scan height controllable in 1 % resolution

Measuring Functions – Digital
Display Readout:

27 automatic functions / expandable; Dual Ultrasound Velocity Measurement Mode for Multi-Layer Structures; Curved Surface / Thickness / Skip correction for angle beam probes; Ultrasound velocity and Probe Delay Auto-Calibration for all types of probes

Freeze (A-Scans and Spectrum Graphs)

Freeze All
Freeze Peak
All signal and spectrum evaluation functions, managing gates and Gain settings are allowed for frozen signals

Encoding:

Straight Line Scanning:

Time-based (built-in real time clock – 0.02 sec resolution)
True-to-location (incremental encoder – 0.5 mm resolution)

XY Scanning:

Airborne Ultrasound (see below)

Airborne Ultrasound Based Encoding Characteristics:

Area of probe manipulation	≤2000x3000 mm ≤80x120 "	≤500x500 mm ≤20x20 "	≤200x200 mm ≤8x8 "
Curvature radius of scanning surface	≥2000 mm / ≥40 "	≥200 mm / ≥8 "	≥37 mm / ≥1.5 "
Scanning Speed	≤150 mm/s ≤6 "/s	≤150 mm/s ≤6 "/s	≤150 mm/s ≤6 "/s
Scan Index	1 to 20 mm controllable in 1 mm step	1 to 20 mm controllable in 1 mm step	0.25 mm; 0.5 mm or 1 to 20 mm controllable in 1 mm step
Resolution for determining of probe coordinates	≥1 mm / ≥0.04 "	≥1 mm / ≥0.04 "	≥0.25 mm / ≥0.01 "
Resolution for determining of probe swiveling angle	-	1°	0.5°
Range of probe swiveling	-	±90°	±90°
Immunity to ambient noise	≤60 dB	≤60 dB	≤60 dB

Coupling Monitor:

Built-in controller and interface for Coupling Monitor suitable for any kind of ultrasonic probe at scanning speed up to 150 mm /sec (6 in /sec); resolution – 0.5 dB

Testing Integrity Monitoring:

Background imaging of Scanning Plan
Recording and imaging of Actual Probe Trace
Generating perceptible marks corresponding to current coupling degree, probe position, and swiveling angle whilst scanning
Interrupting recording and imaging of actual probe trace if missing coupling and/or probe position and/or swiveling angle

Imaging Modes:

Thickness Profile B-Scan, Cross-sectional B-Scan, Plane View CB-Scan, C-Scan, D-Scan, P-Scan, TOFD – depending on mode of operation selected accompanied with corresponding instrument settings

Imaging Characteristics:

Inspection	Angle Beam	Staright Beam
Width of Volume under test	5 to 300 mm controllable in 1 mm resolution – expandable 0.2 to 12 " controllable in 0.01 " resolution - expandable	50 to 2000 mm controllable in 1 mm resolution – expandable 0.2 to 80 " controllable in 0.01 " resolution – expandable
Thickness of Volume under test	5 to 300 mm controllable in 1 mm resolution – expandable 0.2 to 12 " controllable in 0.01 " resolution - expandable	0.5 to 300 mm controllable in 0.1 mm resolution – expandable 0.02 to 12 " controllable in 0.01 " resolution - expandable
Image Resolution	0.5 mm x 0.5 mm x Half Scan Index 0.02 in x 0.02 in x Half Scan Index	0.2 mm x 0.5 mm x Half Scan Index x 0.01 in x 0.02 in x Half Scan Index
Standard Color Scale (Palette)	Pseudo Color Gray Thermal	Pseudo Color Gray Thermal
User Defined Color Scales (Palettes)	≤2³² colors	≤2³² colors
Signal Amplitude Coloring Protocol	Linear TCG Normalizing DAC Normalizing DGS Normalizing Customized	Linear TCG Normalizing DAC Normalizing Customized

Length of one Straight Line Scanning record:

50…20000 mm (2"…800"), automatic scrolling

Method of Record:

Complete raw data recording

Region of Interest:

Controllable over entire Display Delay, Probe Delay, Range, US Velocity and other appropriate instrument settings

Off-Line Image Analysis:

Recovery and play back of A-Scan captured during scanning
Echo-dynamic pattern analysis
Defects sizing and outlining
Statistical analysis of Thickness / Amplitude data
Converting Record into ASCII/MS Excel^® /MS Word^® formats

Data Reporting:

Direct printout of Calibration Dumps, A-Scans, Spectrum Graphs, Thickness Profile B-Scans, cross-sectional B-Scans, plane view CB-Scans, TOFD maps, CB-Scans, C-Scans, D-Scans, P-Scans, TOFD Maps

Data Storage Capacity:

At least 100000 sets including calibration dumps accompanied with A-Scans and/or Spectrum Graphs
At least 10000 sets including calibration dumps accompanied with Thickness Profile B-Scans, cross-sectional B-Scans, plane view CB-Scans, TOFD maps, CB-Scans, C-Scans, D-Scans, P-Scans, or TOFD Maps and complete sequence of A-Scans captured during scanning

Data Logger:

Optional – creates and manages database files capable to store up to 254745 records each and organized as 2D matrix; in database every record includes thickness reading accompanied with corresponding raw data A-Scan and instrument setup

On-Board Computer

AMD LX 800 - 500MHz

RAM:

512 Megabytes

Flash Memory - Quasi HDD

4 Gigabytes

Outputs:

LAN, USB X 2, PS 2, SVGA

Screen:

6.5" High Color Resolution (32 bit) SVGA 640×480 pixels 133×98 mm (5.24" ×3.86") Sun-readable LCD; Maximal A-Scan Size (working area) – 130×92 mm (5.12" × 3.62")

Controls:

Front Panel Sealed Keyboard, Front Panel Sealed Mouse, Touch Screen

Compatibility with the external devices:

PS 2 Keyboard and Mouse, USB Keyboard and Mouse, USB Flash Memory card, Printer
through USB or LAN, PC through USB or LAN, SVGA External Monitor

Operating System:

Windows™ XP Embedded

Power:

Mains - 100…240 VAC, 40…70 Hz, auto-switch; Battery 12V 8AH up to 6 hours continuous operation

Housing:

IP 53 rugged aluminum case with carrying handle

Dimensions:

265×156×121 mm (10.43"×6.14"×4.76") - without battery
265×156×159 mm (10.43"×6.14"×6.26") - with battery

Weight:

3.150 kg (6.93 lbs) - without battery
4.280 kg (9.42 lbs) - with battery